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More by Pierre-Richard Dahoo
Icon image Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
€139.99
Icon image Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
€139.99
Icon image Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
€139.99
Icon image Nanometer-scale Defect Detection Using Polarized Light
Nanometer-scale Defect Detection Using Polarized Light
€139.99
Icon image Nanometer-scale Defect Detection Using Polarized Light
Nanometer-scale Defect Detection Using Polarized Light
€139.99
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