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Nicola Nicolici

Ebooks
Icon image Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
€98.09€68.66
Icon image Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard
€98.09€68.66
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