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Philippe Pougnet

Expert in reliability and product-process technology at Valeo, Philippe Pougnet is a doctor-engineer of the Scientific and Medical University of Grenoble and an INPG engineer. He is responsible for the management of the reliability of mechatronic systems manufactured in mass production.
Ebooks
Icon image Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
€139.99
Icon image Nanometer-scale Defect Detection Using Polarized Light
Nanometer-scale Defect Detection Using Polarized Light
€139.99
Icon image Nanometer-scale Defect Detection Using Polarized Light
Nanometer-scale Defect Detection Using Polarized Light
€139.99
Icon image Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
€139.99
Icon image Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties
€139.99
Icon image Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and RBDO Method
€139.99
Icon image Applications et métrologie à l’échelle nanométrique 1: Matériaux intelligents, ondes électromagnétiques et incertitudes, Volume 1
Applications et métrologie à l’échelle nanométrique 1: Matériaux intelligents, ondes électromagnétiques et incertitudes, Volume 1
Book 9
€13.08
Icon image Les systèmes mécatroniques embarqués 2: Analyse des causes de défaillances, modélisation, simulation et optimisation - 2e édition revue et augmentée, Volume 2
Les systèmes mécatroniques embarqués 2: Analyse des causes de défaillances, modélisation, simulation et optimisation - 2e édition revue et augmentée, Volume 2
€13.08
Icon image Les systèmes mécatroniques embarqués 1: Analyse des causes de défaillances, fiabilité et contraintes - 2e édition revue et augmentée, Volume 1
Les systèmes mécatroniques embarqués 1: Analyse des causes de défaillances, fiabilité et contraintes - 2e édition revue et augmentée, Volume 1
€13.08
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